Spring Probe
In addition to general spring probes, we can provide fine pitch, high-frequency, high current, high temperature,
non-magnetic ... etc the other special purpose probes for customer’s needs.
non-magnetic ... etc the other special purpose probes for customer’s needs.
Alloy Probe
Alloy Probe
For lead-free bumps and balls, due to the adherence of solder, the life of traditional probes is shortened and running cost is increased. Our product development is based on the lead-free solution to meet the users’ needs by launching various types of probes.
The representative type is the “hard Au plating”, which has increased hardness with our uniquely developed “alloy”. It has also improved in durability, stability of contact resistance and can better prevent solder from adhering as compared with traditional probes.
High Frequency Probe
High Frequency Probe
It is essential to ensure the reliability of various semiconductor RF components with high-frequency probe. We will propose our solution for such RF test needs with the precision machining and assembly technology of Seiken.
1.Shortening the total length to 1.5mm (limit length of spring probe) for high-
frequency testing purposes
2.Tip shapes, surface finishing and materials are selectable based on types of
bumps and pads.
3.Maintenance is as easy as traditional Pogo pin-type sockets
1.Shortening the total length to 1.5mm (limit length of spring probe) for high-
frequency testing purposes
2.Tip shapes, surface finishing and materials are selectable based on types of
bumps and pads.
3.Maintenance is as easy as traditional Pogo pin-type sockets
Fine Pitch Probe
Fine Pitch Probe
Fine pitch is trend for electronic components. In order to ensure reliability, high-precision probe is indispensable
Utilize our precision machining and assembly technology, the probe may correspond to 80um Pitch production, solve customer problems encountered.
1.To shorten the outer diameter to 50um to achieve the purpose of Fine Pitch
2. As same as the general spring probes, probe can be replaced individually either one pin.
Utilize our precision machining and assembly technology, the probe may correspond to 80um Pitch production, solve customer problems encountered.
1.To shorten the outer diameter to 50um to achieve the purpose of Fine Pitch
2. As same as the general spring probes, probe can be replaced individually either one pin.
Special Needs Probe
Non-Magnetism Probe
It requires nonmagnetic terminal in the parts inspection of Hall IC, Erectronic Compass, MR/MI Sensor, etc.
Seiken developed highly nonmagnetic probe to realize higher customers needs by improving processing technology and usage of new nonmagnetism materials. We are proud to introduce our solutions based on our long stand experience and know how. |
Probe For High-Temperature
To ensure products reliability, thermal resistance test under high temperature is very essential.
We will propose our test solution under high temperature. |
High-Current Rating Probe
In semiconductor IC test including for automotive, the essential requirement for Probe makers is to arrange the terminal pin to extend durability for high current applications.
We propose our test probes which achieved a good balance between fine-pitch and high current based on our experience and know-how. |
Probe For Customer Design
Spring Probe for Customer Design
It is possible to be customized all kinds of probes for customer needs.
Regardless of length, shape, material, type of plating , high frequency demand, high current demand ... etc. we can correspond them.
If the other requirements are also welcome to propose a review.
Regardless of length, shape, material, type of plating , high frequency demand, high current demand ... etc. we can correspond them.
If the other requirements are also welcome to propose a review.